{"product_id":"computer-vision-for-x-ray-testing-imaging-systems-image-databases-and-algorithms-hardcover","title":"Computer Vision for X-Ray Testing: Imaging, Systems, Image Databases, and Algorithms - Hardcover","description":"\u003cp\u003eby \u003cb\u003eDomingo Mery\u003c\/b\u003e (Author), \u003cb\u003eChristian Pieringer\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis accessible textbook presents an introduction to computer vision algorithms for industrially-relevant applications of X-ray testing. \u003c\/p\u003e\u003cp\u003eCovering complex topics in an easy-to-understand way, without requiring any prior knowledge in the field, the book provides a concise review of the key methodologies in computer vision for solving important problems in industrial radiology. The theoretical coverage is supported by numerous examples, each of which can be tested and evaluated by the reader using a freely-available Matlab toolbox and X-ray image database.\u003c\/p\u003e\u003cp\u003eTopics and features: introduces the mathematical background for monocular and multiple view geometry, which is commonly used in X-ray computer vision systems; describes the main techniques for image processing used in X-ray testing, including image filtering, edge detection, image segmentation and image restoration; presents a range of different representations for X-ray images, explaining how these enable new features to be extracted from the original image; examines a range of known X-ray image classifiers and classification strategies, and techniques for estimating the accuracy of a classifier; discusses some basic concepts for the simulation of X-ray images, and presents simple geometric and imaging models that can be used in the simulation; reviews a variety of applications for X-ray testing, from industrial inspection and baggage screening to the quality control of natural products; provides supporting material at an associated website, including a database of X-ray images and a Matlab toolbox for use with the book's many examples.\u003c\/p\u003e\u003cp\u003eThis classroom-tested and hands-on guide is ideal for graduate and advanced undergraduate students interested in the practical application of image processing, pattern recognition and computer vision techniques for non-destructive quality testing and security inspection.\u003c\/p\u003e\u003ch3\u003eBack Jacket\u003c\/h3\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eBuilding on its strengths as a uniquely accessible textbook combining computer vision and X-ray testing, this enhanced second edition now firmly addresses core developments in deep learning and vision, providing numerous examples and functions using the Python language. \u003c\/p\u003e\u003cp\u003eCovering complex topics in an easy-to-understand way, without requiring any prior knowledge in the field, the book provides a concise review of the key methodologies in computer vision for solving important problems in industrial radiology. The theoretical coverage is strengthened with easily written code examples that the reader can modify when developing new functions for X-ray testing. \u003c\/p\u003e\u003cp\u003e\u003cb\u003eTopics and features: \u003c\/b\u003e\u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eDescribes the core techniques for image processing used in X-ray testing, including image filtering, edge detection, image segmentation and image restoration\u003cbr\u003e\n\u003c\/li\u003e\n\u003cli\u003eIncorporates advances in deep learning, including aspects regarding convolutional neural networks, transfer learning, and generative adversarial networks\u003c\/li\u003e\n\u003cli\u003eProvides more than 65 examples in Python, and is supported by an associated website, including a database of X-ray images and a freely available Matlab toolbox\u003c\/li\u003e\n\u003cli\u003eIncludes new advances in simulation approaches for baggage inspection, simulated X-ray imaging, and simulated structures (such as defects and threat objects)\u003c\/li\u003e\n\u003cli\u003ePresents a range of different representations for X-ray images, explaining how these enable new features to be extracted from the original image\u003c\/li\u003e\n\u003cli\u003eExamines a range of known X-ray image classifiers and classification strategies, and techniques for estimating the accuracy of a classifier\u003c\/li\u003e\n\u003cli\u003eReviews a variety of applications for X-ray testing, from industrial inspection and baggage screening to the quality control of natural products\u003c\/li\u003e\n\u003c\/ul\u003e\u003cp\u003eThis classroom-tested and hands-on text\/guidebook is ideal for advanced undergraduates, graduates, and professionals interested in practically applying image processing, pattern recognition and computer vision techniques for non-destructive quality testing and security inspection.\u003c\/p\u003e\u003cp\u003e\u003cb\u003eDr. Domingo Mery\u003c\/b\u003e is a Full Professor at the Machine Intelligence Group (GRIMA) of the Department of Computer Sciences, and Director of Research and Innovation at the School of Engineering, at the Pontifical Catholic University of Chile, Santiago, Chile. \u003cb\u003eDr. Christian Pieringer\u003c\/b\u003e is an Adjunct Instructor at the same institution.\u003cbr\u003e\u003c\/p\u003e\u003ch3\u003eAuthor Biography\u003c\/h3\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eDr. Domingo Mery\u003c\/b\u003e is a Full Professor at the Machine Intelligence Group (GRIMA) of the Department of Computer Sciences, and Director of Research and Innovation at the School of Engineering, at the Pontifical Catholic University of Chile, Santiago, Chile. \u003cb\u003eDr. Christian Pieringer\u003c\/b\u003e is an Adjunct Instructor at the same institution.\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 456\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 1.06 x 9.21 x 6.14 IN\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003eIllustrated:\u003c\/strong\u003e Yes\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e December 22, 2020\u003c\/div\u003e","brand":"Books by splitShops","offers":[{"title":"Default Title","offer_id":42709483290687,"sku":"9783030567682","price":155.5,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0105\/8226\/1823\/files\/9f6e17bf6c5007945116dc2f8fb834f3.webp?v=1765051592","url":"https:\/\/dhlswag.com\/products\/computer-vision-for-x-ray-testing-imaging-systems-image-databases-and-algorithms-hardcover","provider":"BBB","version":"1.0","type":"link"}