{"product_id":"semiconductor-strain-metrology-principles-and-applications-paperback","title":"Semiconductor Strain Metrology: Principles and Applications - Paperback","description":"\u003cp\u003eby \u003cb\u003eTerence K. S. Wong\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003eThis book surveys the major and newly developed techniques for semiconductor strain metrology. Semiconductor strain metrology has emerged in recent years as a topic of great interest to researchers involved in thin film and nanoscale device characterization. This book employs a tutorial approach to explain the principles and applications of each technique specifically tailored for graduate students and postdoctoral researchers. Selected topics include optical, electron beam, ion beam and synchrotron x-ray techniques. Unlike earlier references, this book specifically discusses strain metrology as applied to semiconductor devices with both depth and focus.\u003c\/p\u003e\u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 144\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.37 x 11 x 8.5 IN\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e February 01, 2018\u003c\/div\u003e","brand":"Books by splitShops","offers":[{"title":"Default Title","offer_id":42711010181183,"sku":"9781608055548","price":173.34,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0105\/8226\/1823\/files\/01a43d2182cd9f7d70d1ae9179e6e23d.webp?v=1765056980","url":"https:\/\/dhlswag.com\/products\/semiconductor-strain-metrology-principles-and-applications-paperback","provider":"BBB","version":"1.0","type":"link"}